High-end X-ray diffraction instrumentation for chemical crystallography
Research Project
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01.06.2015
- 31.05.2016
The determination of the three-dimensional structure of molecules using X-ray diffraction is an invaluable tool of modern chemical research. The prerequisite of such investigations is always the availability of a suitable single crystal. Very high brilliance of the primary X-ray beam in conjunction with an outstanding detector system is the solution in the case where the single crystals obtained are of good quality, but too small for successful structure determination using a conventional X-ray source. The brand new Ga-Metaljet X-ray generator offers a primary beam that is about one order of magnitude more intense than all other X-ray sources that are currently available on the market for laboratory use. The main benefit of this instrument is, that it combines a completely new and innovative setup to produce the X-rays with the well established multilayer optics which results in an extremely intense illumination of very small samples. The anode of this generator consists of a jet of liquid metal inhibiting the problem of the anode melting at higher loads of energy. Together with the single photon counting detectors produced by Dectris in Baden, Switzerland, which market their products under the brand names Pilatus and Eiger, this setup offers the most advanced X-ray detection technology available today. This new solution opens the way for many experiments to be run successfully in house, from small molecule work to macromolecular structures. It is in particular very well suited for small crystals of organic molecules. Its wavelength that is slightly shorter than the wavelength obtained from a Cu-anode makes it possible to collect more data, while the spot separation for long unit cell axes is still ways better than with Mo-radiation. In the following pages it will be demonstrated how this new device increases the possibilities of the investigation and elucidation of the structure of samples for which it would not be possible to measure them successfully using a standard laboratory X-ray source.
Funding
High-end X-ray diffraction instrumentation for chemical crystallography
SNF Projekt (GrantsTool), 01.2015-12.2015 (12)
PI : Neuburger, Markus.
CI : Constable, Edwin Charles,Gademann, Karl,Hamburger, Matthias,Housecroft, Catherine,Mayor, Marcel,Sparr, Christof.